首页> 外国专利> Phasing - kipp displacement method and apparatus for measurement of the chromatic and polarization-dependent dispersion.

Phasing - kipp displacement method and apparatus for measurement of the chromatic and polarization-dependent dispersion.

机译:相位-基普位移法和用于测量色散和偏振相关色散的设备。

摘要

A method for determining at least one optical property of an optical device comprises providing an optical input signal that includes first and second signal components that are modulated at first and second frequencies, respectively, and that have first and second polarization states, respectively. The optical input signal is passed to an optical device. An optical output signal from the optical device is separated into first and second output signals that have third and fourth polarization states, respectively. The first and second output signals are each compared with reference signals at the first and second frequencies to provide four phase shift and amplitude measurements that can be used to determine the at least one optical property of the optical device as a function of wavelength.
机译:一种用于确定光学装置的至少一个光学特性的方法,包括提供光学输入信号,该光学输入信号包括分别在第一和第二频率下调制并且分别具有第一和第二偏振态的第一和第二信号分量。光学输入信号传递到光学设备。来自光学装置的光输出信号被分离成分别具有第三和第四偏振态的第一和第二输出信号。将第一输出信号和第二输出信号分别与第一频率和第二频率处的参考信号进行比较,以提供四个相移和幅度测量值,这些测量值可用于确定光学设备的至少一个光学特性与波长的关系。

著录项

  • 公开/公告号DE60312266T2

    专利类型

  • 公开/公告日2007-11-08

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE2003612266T

  • 发明设计人

    申请日2003-04-11

  • 分类号G01M11/00;

  • 国家 DE

  • 入库时间 2022-08-21 20:27:37

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