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simultaneous and fast calculation of bode diagrams in open and closed loop circuit by means of a binary pseudozufallssequenz

机译:同时通过二进制伪zufallssequenz快速计算开环和闭环电路中的波特图

摘要

A simultaneous rapid open and closed loop bode measurement plot (26, 27) is described in which testing of the servo controlled instrument (9) occurs under closed loop conditions using a binary pseudo-random sequence. The binary pseudo-random sequence (11) is injected into the servo while the system under test is operating closed loop in order to generate bode plots for open loop and closed loop conditions. The present invention provides measurement results approximately 1,000 times faster than a swept sinusoid approach and provides superior dynamic range as compared to random white noise test input sources. IMAGE
机译:描述了同时快速的开环和闭环波德测量图(26、27),其中在伺服闭环条件下使用二进制伪随机序列对伺服控制仪器(9)进行测试。在被测系统运行闭环时,将二进制伪随机序列(11)注入到伺服中,以生成开环和闭环条件的波特图。与随机白噪声测试输入源相比,本发明提供了比扫描正弦曲线方法快大约1,000倍的测量结果,并提供了优越的动态范围。 <图像>

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