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Method of producing pitch fractionizations in semiconductor technology

机译:半导体技术中产生间距细分的方法

摘要

First spacers 5 are formed on sidewalls of a strip-like mask pattern 2. The mask pattern is removed, and second spacers 7 are formed on the first spacers. Gaps between the spacers are filled with a complementary layer 8. The upper surface is planarized to a lower surface level, leaving a periodic succession of the first spacers, the second spacers and the residual parts of the complementary layer. The lateral dimensions are adapted in such a manner that a removal of one or two of the remaining layers renders a periodic pattern of smaller pitch. The method allows the fabrication of arrays of conductive lines to be formed having a width below that obtainable with a mask defined only by photolithographic methods.
机译:在带状掩模图案2的侧壁上形成第一间隔物5。去除掩模图案,并且在第一间隔物上形成第二间隔物7。间隔物之间​​的间隙被互补层8填充。上表面被平坦化至下表面水平,从而留下第一间隔物,第二间隔物和互补层的剩余部分的周期性连续。横向尺寸以这样的方式适应,即,去除剩余的一层或两层会产生较小间距的周期性图案。该方法允许形成导电线阵列,该导电线阵列的宽度小于仅通过光刻方法限定的掩模可获得的宽度。

著录项

  • 公开/公告号GB2428882A

    专利类型

  • 公开/公告日2007-02-07

    原文格式PDF

  • 申请/专利权人 QIMONDA AG;

    申请/专利号GB20060013201

  • 发明设计人 STEFANO PARASCANDOLA;DIRK CASPARY;

    申请日2006-07-03

  • 分类号H01L21/033;

  • 国家 GB

  • 入库时间 2022-08-21 20:26:09

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