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STATIC ELECTRICITY TESTING DEVICE AND STATIC ELECTRICITY TESTING METHOD

机译:静电测试装置及静电测试方法

摘要

PROBLEM TO BE SOLVED: To provide a static electricity testing device and testing method considering charge dispersion performance.;SOLUTION: The static electricity testing device comprises an electric source 10 for supplying charges, a first switch for closing a contact A for connecting the electric source 10 and the terminal of the semiconductor device, and a second switch for closing a contact B, wherein after making the semiconductor device electrify with arbitrary amount of charges by closing the contact A of the first switch for making conduct between the electric source 10 and the any other terminal of the semiconductor device, both the contacts A and B are opened for an arbitrary time by the first and the second switches, and after the arbitrary time, the contact B of the second switch is closed, thereby the charges electrifying the semiconductor device are conducted to the ground. Then the performance test of the semiconductor is performed.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种考虑电荷分散性能的静电测试装置和测试方法;解决方案:静电测试装置包括用于提供电荷的电源10,用于闭合用于连接电源的触点A的第一开关。在图10中,该第二开关用于闭合触点B,其中第二开关用于闭合触点B,其中,在使半导体器件通电后,通过闭合第一开关的触点A使半导体器件通电,该第一开关用于在电源10和电极10之间导通。半导体器件的任何其他端子,第一和第二开关在任意时间将触点A和B断开,并且在任意时间之后,第二开关的触点B闭合,从而使半导体带电设备被引导到地面。然后进行了半导体的性能测试。;版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2008057984A

    专利类型

  • 公开/公告日2008-03-13

    原文格式PDF

  • 申请/专利权人 HITACHI COMPUTER PERIPHERALS CO LTD;

    申请/专利号JP20060231607

  • 发明设计人 ITO YUZO;NATORI SHOJI;

    申请日2006-08-29

  • 分类号G01R31/26;

  • 国家 JP

  • 入库时间 2022-08-21 20:25:22

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