首页> 外国专利> CHARGED PARTICLE SPIN POLARIMETER, MICROSCOPE, AND PHOTOELECTRON SPECTROSCOPY DEVICE

CHARGED PARTICLE SPIN POLARIMETER, MICROSCOPE, AND PHOTOELECTRON SPECTROSCOPY DEVICE

机译:带电粒子自旋极化器,显微镜和光电子能谱仪

摘要

PROBLEM TO BE SOLVED: To provide a charged particle spin polarimeter capable of resolving the magnetic moment of charged particles with high efficiency.;SOLUTION: The charged particle spin polarimeter has a pair of convex and concave magnetic poles for applying a magnetic field with gradient to an incident charged particle and a pair of flat plate electrodes to apply an electric field to a charged particle to cancel the Lorentz force that the charged particle receives from the magnetic field. The magnetic moment of a charged particle in the direction of the magnetic field is resolved by the interaction between the gradient of the magnetic field and the magnetic moment of the charged particle.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种能够高效解决带电粒子的磁矩的带电粒子自旋旋光仪;解决方案:带电粒子自旋旋光仪具有一对凹凸磁极,可将梯度磁场施加到一个入射的带电粒子和一对平板电极,以向带电粒子施加电场,以抵消带电粒子从磁场中接收到的洛伦兹力。带电粒子在磁场方向上的磁矩通过磁场的梯度和带电粒子的磁矩之间的相互作用来解决。;版权所有:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP2008251525A

    专利类型

  • 公开/公告日2008-10-16

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP20080002093

  • 发明设计人 TAKAHASHI TERUO;

    申请日2008-01-09

  • 分类号H01J37/244;H01J37/28;

  • 国家 JP

  • 入库时间 2022-08-21 20:25:03

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