首页> 外国专利> ELEMENT ANALYSIS METHOD AND ELEMENT ANALYZER IN SAMPLE SUBJECTED TO MELTING TREATMENT IN OXYGEN ATMOSPHERE

ELEMENT ANALYSIS METHOD AND ELEMENT ANALYZER IN SAMPLE SUBJECTED TO MELTING TREATMENT IN OXYGEN ATMOSPHERE

机译:氧气氛熔融处理样品中的元素分析方法和元素分析仪

摘要

PPROBLEM TO BE SOLVED: To provide an element analysis method and an element analyzer having high measurement accuracy, capable of securing reliability to a measured value, concerning element analysis in a sample subjected to melting treatment in an oxygen atmosphere. PSOLUTION: The element analyzer has a melting furnace 1 for installing the sample S inside and performing melting treatment thereof, an oxygen supply path 1a for supplying oxygen into the melting furnace 1, a secondary treatment system 20 for performing secondary treatment of sample gas delivered from the melting furnace 1, and a gas analyzer 2 for measuring a specific component concentration in the sample gas subjected to the secondary treatment. The element analyzer is characterized by having an adsorption treatment part 3 having activated carbon built in the secondary treatment system 20. PCOPYRIGHT: (C)2008,JPO&INPIT
机译:<解决的问题:提供一种涉及在氧气气氛中进行了熔融处理的样品中的元素分析的,具有高测量精度,能够确保测量值的可靠性的元素分析方法和元素分析仪。

解决方案:元素分析仪具有用于将样品S安装在内部并进行熔融处理的熔融炉1,用于向熔融炉1中供给氧气的氧气供给路径1a,用于对样品进行二次处理的二次处理系统20。从熔融炉1送出的气体,以及用于测定经过二次处理的试样气体中的特定成分浓度的气体分析仪2。元素分析仪的特征在于,在二次处理系统20中内置有具有活性炭的吸附处理部3。

COPYRIGHT:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2008157799A

    专利类型

  • 公开/公告日2008-07-10

    原文格式PDF

  • 申请/专利权人 HORIBA LTD;

    申请/专利号JP20060348017

  • 发明设计人 UCHIHARA HIROSHI;SAKAKURA SEIJI;

    申请日2006-12-25

  • 分类号G01N31/00;G01N31/12;G01N30/00;G01N30/88;G01N30/26;G01N21/61;

  • 国家 JP

  • 入库时间 2022-08-21 20:23:33

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