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COMPOUND MICROSCOPE OF TRANSMISSION ELECTRON MICROSCOPE AND NEAR-FIELD OPTICAL MICROSCOPE

机译:透射电子显微镜与近场光学显微镜的复合显微镜

摘要

PROBLEM TO BE SOLVED: To achieve a compound microscope enabling to perform a near-field optical microscope observation under a structural observation of a transmission electron microscope capable of discriminating atoms with the intention to solve the low resolution problem of the near-field optical microscope in a structural observation.;SOLUTION: A near-field optical microscope 36 is installed in a sample chamber 35 of a transmission electron microscope 34 and controlled by a computer 9 for the use of control/image display. The near-field optical microscope 36 comprises a light source 38, a sample mounting 23 equipped with a board 6 supporting a sample 2, a means connected with the light source to emit light to the sample 2, a light receiving means, spectroscopic means of the near-field light from the sample 2 and a means to scan the light receiving means to the sample 2 relatively. Therefore, the lattice image observation by the transmission electron microscope of the sample 2 can be done and the spectroscopic analysis of the corresponding lattice image can be done also.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:为了实现一种复合显微镜,该复合显微镜能够在能够分辨原子的透射电子显微镜的结构观察下进行近场光学显微镜观察,从而解决近场光学显微镜的低分辨率问题。解决方案:近场光学显微镜36安装在透射电子显微镜34的样品室35中,并由计算机9控制以用于控制/图像显示。近场光学显微镜36包括光源38,配备有支撑样品2的板6的样品架23,与光源连接以向样品2发光的装置,光接收装置,光谱仪。来自样品2的近场光和相对地将光接收装置扫描到样品2的装置。因此,可以通过透射电子显微镜观察样品2的晶格图像,并且还可以对相应的晶格图像进行光谱分析。;版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2007322396A

    专利类型

  • 公开/公告日2007-12-13

    原文格式PDF

  • 申请/专利权人 UNIV OF TSUKUBA;

    申请/专利号JP20060156571

  • 发明设计人 KITSUKA NORIYUKI;

    申请日2006-06-05

  • 分类号G01N13/10;G01N13/14;H01J37/26;H01J37/28;

  • 国家 JP

  • 入库时间 2022-08-21 20:23:08

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