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METHOD OF EVALUATING BEARISH ERROR OF STATISTICAL TIMING ANALYSIS

机译:统计时序分析的看跌误差评估方法

摘要

PPROBLEM TO BE SOLVED: To provide a method which is capable of obtaining an upper limit of errors in a bearish direction in LSI yield prediction calculation results of statistical timing analysis or specifying a range of a LSI yield predictive value (actual LSI yield) in the case of the absence of calculation error. PSOLUTION: First, a yield is calculated by normal SSTA. Next, an independent LL set which is a subset having sets of delay element sets which include only gate and network not being shared by two or more paths is determined. Next, a yield is calculated by SSTA while using only the independent LL set. Thereby, it is clarified that the actual yield is between the yield obtained by normal SSTA and the yield obtained by SSTA using only the independent LL set. PCOPYRIGHT: (C)2008,JPO&INPIT
机译:

要解决的问题:提供一种方法,该方法能够获得统计时序分析的LSI产量预测计算结果中的看跌方向的误差上限,或者指定LSI产量预测值(实际LSI产量)的范围)在没有计算错误的情况下。

解决方案:首先,通过常规SSTA计算产率。接下来,确定独立的LL集,该LL集是具有延迟元素集的集合的子集,该延迟元素集的集合仅包括未被两个或更多路径共享的门和网络。接下来,由SSTA在仅使用独立LL集的情况下计算产量。从而,明确了实际收率在仅使用独立LL集的情况下,在通过正常SSTA获得的收率与通过SSTA获得的收率之间。

版权:(C)2008,日本特许厅&INPIT

著录项

  • 公开/公告号JP2008015747A

    专利类型

  • 公开/公告日2008-01-24

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP20060185515

  • 发明设计人 IKEDA HIROSHI;

    申请日2006-07-05

  • 分类号G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 20:22:18

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