ANALYSIS METHOD FOR EASY TESTABILITY AND ANALYSIS SYSTEM FOR EASY TESTABILITY AS WELL AS DESIGN METHOD FOR EASY TESTABILITY

摘要

PROBLEM TO BE SOLVED: To provide an analysis system for easy testability, which executes an analysis for the easy testability by implementing analysis for the controllability/observability in a stage for describing hardware not depending on an architecture.;SOLUTION: In the analysis system for easy testability a function description data for defining a hardware function is input by using a format, which does not depend on the architecture, a register variable is recognized, which can be inferred by a store element in the function description data, an event, which will occur by adding random numbers to the register variables being recognized is simulated; and thus a cause for a reduced detection of defective rates by using LogicBIST is analysed based on a toggle rate/an event occurring rate of a bus and a net, and also variables in the function description data, through results of simulation.;COPYRIGHT: (C)2008,JPO&INPIT