首页> 外国专利> LIGAND ANALYZING METHOD DUE TO LOCALIZED SURFACE PLASMON RESONANCE METHOD AND MASS ANALYZING METHOD, AND SENSOR ELEMENT THEREFOR

LIGAND ANALYZING METHOD DUE TO LOCALIZED SURFACE PLASMON RESONANCE METHOD AND MASS ANALYZING METHOD, AND SENSOR ELEMENT THEREFOR

机译:局部表面等离子体共振法和质量分析法的配体分析方法及传感器元件

摘要

PROBLEM TO BE SOLVED: To provide a ligand analyzing method capable of simply performing the analyzing operation of the ligand bonded to a certain substance by mass analysis with high sensitivity and higher reproducibility, and a sensor element therefor.;SOLUTION: The ligand analyzing method includes processes of: bringing the selective coupling substance on the sensor element, which is equipped with a substrate, a plurality of nanosize metal regions provided on the substrate and the selective coupling substance fixed on the nanosize metal regions, into contact with the ligand selectively coupled to the selective coupling substance in a sample to be inspected; measuring the coupling of the selective coupling substance with the ligand by a localized surface plasmon resonance method; and applying the sensor element to the mass analyzing method as it is to perform the mass analysis of the ligand.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种配体分析方法,其能够通过具有高灵敏度和更高再现性的质量分析来简单地进行结合至某种物质的配体的分析操作,以及用于该配体分析的传感器元件。方法:使选择性偶联物质在配备有基底的传感器元件上,设置在基底上的多个纳米级金属区域和固定在纳米级金属区域上的选择性偶联物质与选择性偶联至其上的配体接触被检样品中的选择性偶联物质;通过局部表面等离子体激元共振法测量选择性偶联物质与配体的偶联;并将其应用于质量分析方法,对配体进行质量分析。;版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2008025989A

    专利类型

  • 公开/公告日2008-02-07

    原文格式PDF

  • 申请/专利权人 KEIO GIJUKU;

    申请/专利号JP20060194974

  • 发明设计人 IWASAKI AKI;SUZUKI KOJI;

    申请日2006-07-15

  • 分类号G01N21/27;G01N33/543;G01N27/62;

  • 国家 JP

  • 入库时间 2022-08-21 20:20:19

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号