首页> 外国专利> Modulation frequency characteristic measuring apparatus and measurement method of the photodetector

Modulation frequency characteristic measuring apparatus and measurement method of the photodetector

机译:调制频率特性测量装置和光电探测器的测量方法

摘要

PPROBLEM TO BE SOLVED: To provide a method for measuring accurately the frequency characteristic of a detector for light to be measured without using a reference photodetector, and its measuring device. PSOLUTION: Light from a light source 9 is intensity-modulated by external modulators 10, 11 driven by an oscillator 12, and the detector 14 for the light to be measured is irradiated therewith, and the intensity of the light detected by the detector 14 is converted into an electric signal, to thereby measure the intensity by a frequency analyzer. In this case, only confirmation that the modulation characteristic of the light source 9 or the external modulators 10, 11 can work in an object frequency range is required, and the accurate modulation characteristic is not required to be known. PCOPYRIGHT: (C)2005,JPO&NCIPI
机译:

要解决的问题:提供一种无需使用参考光电探测器即可准确测量待测光探测器的频率特性的方法及其测量装置。

解决方案:来自光源9的光由振荡器12驱动的外部调制器10、11进行强度调制,并向其照射用于待测光的检测器14,并且由光源12检测到的光的强度。检测器14被转换成电信号,从而通过频率分析仪测量强度。在这种情况下,仅需要确认光源9或外部调制器10、11的调制特性可以在目标频率范围内工作,并且不需要知道精确的调制特性。

版权:(C)2005,JPO&NCIPI

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号