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Macro inspection method and Macro Inspection System

机译:宏观检查方法及宏观检查系统

摘要

The macro inspection apparatus includes a substrate holder for holding a substrate under test; while the substrate is illuminated by the illumination light for supporting said substrate holder; for irradiating illumination light to the substrate macro illumination optical system The blowing of air to the substrate that is passed to the substrate holder; substrate transport mechanism for transferring the substrate between said substrate holder; substrate holder drive mechanism for controlling the posture of the substrate holder substrate positioning mechanism; This a substrate positioning mechanism for positioning the reference position of the substrate holder on the substrate in the floating state by the substrate floating mechanism; By performing a substrate floating mechanism to float from the substrate holder and the substrate I comprises; substrate and fixing mechanism for fixing the substrate holder to the substrate that has been positioned by.
机译:宏观检查装置包括:用于保持被测基板的基板支架;同时用照明光照亮基板以支撑所述基板支架。用于向基板宏观照明光学系统照射照明光。基板传送机构,用于在所述基板支架之间传送基板;基板支架驱动机构,用于控制基板支架的位置。该基板定位机构通过基板浮起机构将基板保持架的基准位置以浮起状态定位在基板上。通过执行从基板保持器浮起的基板浮起机构,基板I包括:基板和用于将基板保持器固定到已定位的基板的固定机构。

著录项

  • 公开/公告号JPWO2006035703A1

    专利类型

  • 公开/公告日2008-05-15

    原文格式PDF

  • 申请/专利权人 オリンパス株式会社;

    申请/专利号JP20060537713

  • 发明设计人 加藤 洋;藤崎 暢夫;岡平 裕幸;

    申请日2005-09-26

  • 分类号G01N21/84;G01M11/00;G02F1/13;H01J9/42;G09F9/00;

  • 国家 JP

  • 入库时间 2022-08-21 20:17:34

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