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Method of forming a nitride film, forming apparatus, oxynitride film, nitride film, and the substrate and oxynitride film
Method of forming a nitride film, forming apparatus, oxynitride film, nitride film, and the substrate and oxynitride film
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机译:形成氮化物膜的方法,形成设备,氧氮化物膜,氮化物膜以及基板和氧氮化物膜
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摘要
I to form the oxynitride film and nitride film uniform low temperature and high-speed nitride is possible dependence of the nitriding time and nitriding temperature of nitriding reaction and, without. Pressure under a pressure of 300 (Torr) or higher, and set up a solid dielectric on the facing surface of at least one of the pair of opposing electrodes, a nitrogen gas containing an oxide of 0.2% or less between the opposed electrodes of the pair brought into contact with the object to be treated and N 2 (H.I.R.) active species or plasma (2 nd p.s.), nitriding treatment to said workpiece surface N 2 is obtained by applying an electric field by introducing I will form a film / oxynitride film.
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机译:形成氮氧化物膜和氮化膜的均匀的低温和高速氮化物可能取决于氮化时间和氮化反应的氮化温度,而没有。在300(Torr)或更高的压力下加压,并在一对相对电极中至少一个的相对表面上建立固体电介质,在相对电极之间的氮氧化物中含有0.2%或更少的氧化物对与要处理的物体和 N Sub> 2(HIR)活性物质或血浆(2 Sup> nd ps)接触的 Sup>氮化处理所述工件表面 N Sub> 2是通过引入电场而施加I而获得的,将形成膜/氮氧化物膜。
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