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Method of forming contact plugs for eliminating tungsten seam issue

机译:形成用于消除钨接缝问题的接触塞的方法

摘要

A method of forming a contact plug of an eDRAM device includes the following steps: forming a tungsten layer with tungsten seam on a dielectric layer to fill a contact hole; removing the tungsten layer from the top surface of the dielectric layer, recessing the tungsten layer in the contact hole to form a recess of about 600˜900 Angstroms in depth below the top surface of the dielectric layer, depositing a conductive layer on the dielectric layer and the recessed tungsten plug to fill the recess; and removing the conductive layer from the top surface of the dielectric layer to form a conductive plug on the recessed tungsten plug in the contact hole.
机译:一种形成eDRAM器件的接触塞的方法,包括以下步骤:在介电层上形成具有钨接缝的钨层以填充接触孔。从介电层的顶表面去除钨层,在接触孔中凹陷钨层,以在介电层的顶表面下方形成约600〜900埃的深度的凹槽,在介电层上沉积导电层凹陷的钨塞填充凹陷。从介电层的顶表面去除导电层,以在接触孔中的凹入钨塞上形成导电塞。

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