首页> 外国专利> SEMICONDUCTOR INTEGRATED CIRCUIT PERFORMING A VOLTAGE COMPARISON AND PREVENTING DETERIORATION OF A VOLTAGE COMPARISON ACCURACY

SEMICONDUCTOR INTEGRATED CIRCUIT PERFORMING A VOLTAGE COMPARISON AND PREVENTING DETERIORATION OF A VOLTAGE COMPARISON ACCURACY

机译:进行电压比较并防止电压比较精度降低的半导体集成电路

摘要

A semiconductor integrated circuit includes a differential amplifier circuit receiving first and second input voltages, a latch circuit comparing a voltage received from a first output terminal of the differential amplifier circuit through a first capacitor and a voltage received from the second output terminal of the differential amplifier circuit through a second capacitor and providing a digital signal representing a result of a comparison between the first and second input voltages, and a third capacitor having a first terminal coupled to a second terminal of the first capacitor and a second terminal coupled to a second terminal of the second capacitor.
机译:半导体集成电路包括:差分放大器电路,其接收第一和第二输入电压;锁存电路,其比较通过第一电容器从差分放大器电路的第一输出端子接收的电压和从差分放大器的第二输出端子接收的电压。电路通过第二电容器并提供表示第一输入电压和第二输入电压之间的比较结果的数字信号,以及第三电容器,第三电容器的第一端子耦合到第一电容器的第二端子,第二端子耦合到第二端子第二个电容器的

著录项

  • 公开/公告号US2008143577A1

    专利类型

  • 公开/公告日2008-06-19

    原文格式PDF

  • 申请/专利权人 JUN TOMISAWA;KAZUYASU NISHIKAWA;

    申请/专利号US20070951541

  • 发明设计人 KAZUYASU NISHIKAWA;JUN TOMISAWA;

    申请日2007-12-06

  • 分类号H03M1/34;

  • 国家 US

  • 入库时间 2022-08-21 20:15:52

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