首页> 外国专利> Semiconductor constructions, methods of forming semiconductor constructions, and methods of recessing materials within openings

Semiconductor constructions, methods of forming semiconductor constructions, and methods of recessing materials within openings

机译:半导体构造,形成半导体构造的方法以及在开口内使材料凹陷的方法

摘要

Some embodiments include methods of recessing multiple materials to a common depth utilizing etchant comprising C4F6 and C4F8. The recessed materials may be within isolation regions, and the recessing may be utilized to form trenches for receiving gatelines. Some embodiments include structures having an island of semiconductor material laterally surrounded by electrically insulative material. Two gatelines extend across the insulative material and across the island of semiconductor material. One of the gatelines is recessed deeper into the electrically insulative material than the other.
机译:一些实施例包括利用包括C 4 F 6 和C 4 F 8 的蚀刻剂将多种材料凹入共同深度的方法。子>。凹陷的材料可以在隔离区域内,并且凹陷可以用于形成用于接收栅极线的沟槽。一些实施例包括具有半导体材料岛的结构,该半导体材料岛横向地被电绝缘材料包围。两条栅极线跨过绝缘材料和半导体材料岛。一条栅极线比另一条栅极线更深地嵌入电绝缘材料中。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号