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Process for improving design limited yield by efficiently capturing and storing production test data for analysis using checksums, hash values, or digital fault signatures
Process for improving design limited yield by efficiently capturing and storing production test data for analysis using checksums, hash values, or digital fault signatures
A process for conserving storage space and time while recording not only a pass or fail result per die but also additional failure test pattern data by computing and comparing digital fault signatures or hash values on a tester.
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