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SOI-based inverse nanotaper optical detector

机译:基于SOI的逆纳米锥光探测器

摘要

A photodetector integrated within a silicon-on-insulator (SOI) structure is formed directly upon an inverse nanotaper endface coupling region to reduce polarization sensitivity at the detector's input. The photodetector may be germanium-based PN (PIN) junction photodetector, a SiGe photodetector, a metal/silicon Schottky barrier photodetector, or any other suitable silicon-based photodetector. The inverse nanotaper photodetector may also be formed as an in-line monitoring device, converting only a portion of the in-coupled optical signal and allowing for the remainder to thereafter propagate along an associated optical waveguide.
机译:集成在绝缘体上硅(SOI)结构中的光电检测器直接形成在反纳米锥端面耦合区域上,以降低检测器输入端的偏振灵敏度。光电探测器可以是基于锗的PN(PIN)结光电探测器,SiGe光电探测器,金属/硅肖特基势垒光电探测器或任何其他合适的基于硅的光电探测器。反向纳米锥光检测器也可以形成为在线监测装置,仅转换部分耦合光信号,并允许其余部分沿相关的光波导传播。

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