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Atomic force microscope and method of energy dissipation imaging using the same

机译:原子力显微镜及使用其的能量耗散成像方法

摘要

An atomic force microscope and method of energy dissipation imaging using such atomic force microscope. The atomic force microscope has a cantilever equipped with a probe for making contact with a sample, a vibrating unit for vibrating the cantilever, a vibration control unit for controlling the vibrating unit based on a preset value of amplitude, a vibration detector for detecting the amplitude of the vibration of the cantilever, and an imaging unit for creating an energy dissipation image based on the vibration of the cantilever. Error information based on the difference between the value of amplitude detected by the amplitude detection unit and the preset value of amplitude is fed back to the vibrating unit. Thus, the vibrating unit vibrates the cantilever to drive it into resonance. The imaging unit creates an energy dissipation image based on the difference information.
机译:原子力显微镜和使用这种原子力显微镜的能量耗散成像方法。原子力显微镜具有:悬臂,其装备有用于与样品接触的探针;振动单元,其使悬臂振动;振动控制单元,其基于振幅的预设值控制振动单元;振动检测器,其用于检测振幅悬臂的振动,以及用于基于悬臂的振动产生能量消散图像的成像单元。基于由振幅检测单元检测到的振幅值与振幅的预设值之间的差的误差信息被反馈到振动单元。因此,振动单元使悬臂振动以使其共振。成像单元基于差异信息创建能量消散图像。

著录项

  • 公开/公告号US7387016B2

    专利类型

  • 公开/公告日2008-06-17

    原文格式PDF

  • 申请/专利权人 KEIICHI NAKAMOTO;

    申请/专利号US20060375686

  • 发明设计人 KEIICHI NAKAMOTO;

    申请日2006-03-14

  • 分类号G01B5/28;

  • 国家 US

  • 入库时间 2022-08-21 20:11:16

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