首页>
外国专利>
Mask inspection DNIR placement based on location of tri-tone level database images (2P shapes)
Mask inspection DNIR placement based on location of tri-tone level database images (2P shapes)
展开▼
机译:根据三色调级别数据库图像(2P形状)的位置进行口罩检查DNIR放置
展开▼
页面导航
摘要
著录项
相似文献
摘要
Methods, systems, program storage devices and computer program products for mask inspection that automate the detection and placement of do not inspect regions (“DNIR”) for intentionally induced defects on masks. A location of an intentional defect is identified on a mask, and then logic relating to this location is translated into a shape that represents a DNIR for the intentional defect. A second shape representing another DNIR of the mask is provided. It is then determined if the first and second shapes for DNIRs violate a processing rule of the inspection tool, and if so, the violated rule is corrected for by generating a single contiguous DNIR by overlapping the first and second shapes. The inspection tool then utilizes the first and second shapes representing DNIRs, along with any single contiguous DNIRs, to inspect the mask for unintentional defects while avoiding intentional defects.
展开▼