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Inspection data analysis program, inspection tools, review apparatus and yield analysis apparatus

机译:检验数据分析程序,检验工具,检查装置和成品率分析装置

摘要

An operation unit executes a process for calling to a main memory first data representative of a result of equipment QC applied to a production unit. A process for reading out to the main memory an amount of change in failure in accordance with particle numbers calculated for individual defect sizes from second inspection data representative of a result of equipment QC is applied to the production unit. Electrical test data of a product processed by the production unit during a period inclusive of the time that the second inspection is carried outis also read to the main memory. A process is also executed for using the amount of change in failure in accordance with the calculated particle numbers and the particle numbers for individual sizes determined from the first inspection data to determine an impact on the product by particles generated in the production equipment when the first inspection data is detected.
机译:操作单元执行用于将代表施加到生产单元的设备QC的结果的第一数据调用到主存储器的处理。将用于根据从代表设备QC的结果的第二检查数据针对各个缺陷尺寸计算出的颗粒数来读取故障变化量的过程应用于主存储器,该过程用于生产单元。在第二次检查期间(包括第二次检查的时间)内,由生产单元处理的产品的电气测试数据也将读取到主存储器中。还执行用于根据计算出的颗粒数和从第一检查数据确定的单个尺寸的颗粒数来使用故障变化量的过程,以确定当第一检测到检测数据。

著录项

  • 公开/公告号US7421357B2

    专利类型

  • 公开/公告日2008-09-02

    原文格式PDF

  • 申请/专利权人 MAKOTO ONO;YOHEI ASAKAWA;

    申请/专利号US20040887827

  • 发明设计人 MAKOTO ONO;YOHEI ASAKAWA;

    申请日2004-07-12

  • 分类号G06F19;G01R31/26;

  • 国家 US

  • 入库时间 2022-08-21 20:10:26

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