首页> 外国专利> Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedure

Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedure

机译：半导体元件测试装置，特别是具有半导体元件测试装置的数据缓冲元件，以及半导体元件测试程序

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摘要

The invention relates to a semi-conductor component test procedure, and a semiconductor component test device (10b), which comprise:a device (43) for generating pseudo-random address values to be applied to corresponding address inputs of a semi-conductor component (2b), in particular a memory component, to be tested.

机译：本发明涉及一种半导体元件测试程序以及一种半导体元件测试装置（ 10 b ），包括：用于生成伪随机地址值的设备（ 43 ），该设备将应用于半导体组件（ 2 b ），尤其是要测试的内存组件。 展开▼

著录项

公开/公告号US7421629B2

专利类型

公开/公告日2008-09-02

原文格式PDF

申请/专利权人 THORSTEN BUCKSCH;MARTIN MEIER;
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申请/专利号US20050253814

发明设计人 MARTIN MEIER;THORSTEN BUCKSCH;
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申请日2005-10-20

分类号G11C29/00;

国家 US

入库时间 2022-08-21 20:10:20

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机译：半导体元件测试装置，特别是具有半导体元件测试装置的数据缓冲元件，以及半导体元件测试程序

4. Semi-conductor component test device with shift register, and semi-conductor component test procedure [P] . 美国专利： US7415649B2 . 2008-08-19

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5. Semi-conductor component test device with shift register, and semi-conductor component test procedure [P] . 美国专利： US2006253756A1 . 2006-11-09

机译：具有移位寄存器的半导体元件测试装置及半导体元件测试步骤

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