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Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam

机译:电荷量测量方法,带电束的位移值测量方法,电荷量测量装置和带电束的位移值测量装置

摘要

A charge amount measurement method comprises: interposing a measurement subject between a first substance and a second substance having a through hole; measuring a first collision position where a charged beam passed through the through hole and vicinity of the measurement subject collides against the first substance, in a state that there is no potential difference between the first substance and the second substance, measuring a second collision position where a charged beam passed through the through hole and vicinity of the measurement subject collides against the first substance, in a state that there is a potential difference between the first substance and the second substance, and measuring a charge amount of the measurement subject based on a difference between the measured first collision position and the measured second collision position.
机译:电荷量测量方法包括:在具有通孔的第一物质和第二物质之间插入测量对象;在第一物质和第二物质之间没有电势差的状态下,测量穿过通孔和被测对象附近的带电束与第一物质碰撞的第一碰撞位置,测量第二碰撞位置,其中在第一物质和第二物质之间存在电势差的状态下,穿过通孔和被测物附近的带电束与第一物质碰撞,并基于a来测量被测物的电荷量。测量的第一碰撞位置和测量的第二碰撞位置之间的差。

著录项

  • 公开/公告号US7321232B2

    专利类型

  • 公开/公告日2008-01-22

    原文格式PDF

  • 申请/专利权人 MASAKAZU HAYASHI;

    申请/专利号US20060348246

  • 发明设计人 MASAKAZU HAYASHI;

    申请日2006-02-07

  • 分类号G01R31/305;H01J37/28;

  • 国家 US

  • 入库时间 2022-08-21 20:09:54

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