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Abnormal shadow detecting method, abnormal shadow detecting system and abnormal shadow detecting program

机译:异常阴影检测方法,异常阴影检测系统和异常阴影检测程序

摘要

Primary prospective abnormal shadow regions in images of objects are detected by different kinds of detecting processes. Whether or not the respective primary prospective abnormal shadow regions are of a desired abnormal shadow is determined by methods different from each other according to the kinds of processes by which the respective primary prospective abnormal shadow regions are detected. Only primary prospective abnormal shadow regions which are determined to be of a desired abnormal shadow are output as final prospective abnormal shadow regions.
机译:通过不同种类的检测过程来检测物体图像中的主要预期异常阴影区域。根据检测各个主要预期异常阴影区域的过程的种类,通过彼此不同的方法来确定各个主要预期异常阴影区域是否为期望的异常阴影。仅输出被确定为期望的异常阴影的主要预期异常阴影区域作为最终预期异常阴影区域。

著录项

  • 公开/公告号US7324676B2

    专利类型

  • 公开/公告日2008-01-29

    原文格式PDF

  • 申请/专利权人 HIDEYA TAKEO;

    申请/专利号US20040779841

  • 发明设计人 HIDEYA TAKEO;

    申请日2004-02-18

  • 分类号G06K9/00;

  • 国家 US

  • 入库时间 2022-08-21 20:09:23

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