首页> 外国专利> FAULT DIAGNOSIS APPARATUS AND METHOD FOR SYSTEM-ON-CHIP (SOC) AND SOC IN WHICH FAULT IS CAPABLE OF BEING DIAGNOSED

FAULT DIAGNOSIS APPARATUS AND METHOD FOR SYSTEM-ON-CHIP (SOC) AND SOC IN WHICH FAULT IS CAPABLE OF BEING DIAGNOSED

机译:可诊断故障的片上系统(SOC)和SOC的故障诊断设备和方法

摘要

A fault diagnosis apparatus and method which can immediately or remotely diagnose faults in a system-on-chip (SoC) mounted on a product, and a system-on-chip in which faults are capable of being diagnosed. The fault diagnosis apparatus for an SoC includes an instruction input unit which inputs fault diagnosis request instruction to the SoC, and an output unit which receives a diagnosis result from the SoC and outputs the diagnosis result, and the SoC receives the fault diagnosis request instruction, diagnoses its own faults, and outputs the diagnosis result to the output unit, thereby immediately or remotely diagnosing faults in the SoC mounted on a product.
机译:可以立即或远程诊断安装在产品上的片上系统(SoC)中的故障的故障诊断设备和方法,以及能够诊断故障的片上系统。用于SoC的故障诊断装置包括:指令输入单元,其向SoC输入故障诊断请求指令;以及输出单元,其从SoC接收诊断结果并输出诊断结果,并且SoC接收故障诊断请求指令;诊断自己的故障,并将诊断结果输出到输出单元,从而立即或远程诊断产品上安装的SoC中的故障。

著录项

  • 公开/公告号IN2006MU01407A

    专利类型

  • 公开/公告日2008-08-29

    原文格式PDF

  • 申请/专利权人

    申请/专利号IN1407/MUM/2006

  • 发明设计人 JUM HAM BAE;

    申请日2006-09-01

  • 分类号G06F11/00;

  • 国家 IN

  • 入库时间 2022-08-21 20:07:44

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