首页> 外国专利> Method for manufacturing device for supporting substrate during semiconductor manufacture, involves forming surface roughness on upper surface of plate by electromagnetic radiation without disturbing initial flat surface of plate

Method for manufacturing device for supporting substrate during semiconductor manufacture, involves forming surface roughness on upper surface of plate by electromagnetic radiation without disturbing initial flat surface of plate

机译:用于在半导体制造过程中支撑衬底的装置的制造方法,包括在不干扰板的初始平坦表面的情况下通过电磁辐射在板的上表面上形成表面粗糙度。

摘要

A device comprising a flat plate with upper surface is formed in which the upper surface has an initial flat surface. The surface roughness is formed on the upper surface of plate at which the substrate is to be positioned without disturbing the initial flat surface of the upper surface. An independent claim is also included for device for supporting substrate during semiconductor manufacture.
机译:形成包括具有上表面的平板的装置,其中上表面具有初始平坦表面。在不影响上表面的初始平坦表面的情况下,在要放置基板的板的上表面上形成表面粗糙度。还包括用于在半导体制造期间支撑衬底的装置的独立权利要求。

著录项

  • 公开/公告号NL1031985C2

    专利类型

  • 公开/公告日2007-12-13

    原文格式PDF

  • 申请/专利权人 XYCARB CERAMICS B.V.;

    申请/专利号NL20061031985

  • 申请日2006-06-12

  • 分类号H01L21/687;B23K26/40;C04B41;

  • 国家 NL

  • 入库时间 2022-08-21 20:06:52

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