首页> 外国专利> Fremgangsmate til dannelse av ferroelektriske tynnfilmer, bruk av fremgangsmaten og et minne med et minnemateriale av ferroelektrisk oligomer

Fremgangsmate til dannelse av ferroelektriske tynnfilmer, bruk av fremgangsmaten og et minne med et minnemateriale av ferroelektrisk oligomer

机译:铁电薄膜的形成方法,该方法的使用以及具有铁电低聚物的存储材料的存储

摘要

In a method for forming ferroelectric thin films of vinylidene fluoride oligomer or vinylidene fluoride co-oligomer, oligomer material is evaporated in vacuum chamber and deposited as a thin film on a substrate which is cooled to a temperature in a range determined by process parameters and physical properties of the deposited VDF oligomer or co-oligomer thin film. In an application of the method of the invention for fabricating ferroelectric memory cells or ferroelectric memory devices, a ferroelectric memory material is provided in the form of a thin film of VDF oligomer or VDF co-oligomer located between electrode structures. A ferroelectric memory cell or ferroelectric memory device fabricated in this manner has the memory material in the form of a thin film of VDF oligomer or VDF co-oligomer provided on at least one of first and second electrode structures, such that the thin film is provided on at least one of the electrode structures or between first and second electrode structures.
机译:在形成偏二氟乙烯低聚物或偏二氟乙烯共低聚物的铁电薄膜的方法中,低聚物材料在真空室中蒸发并作为薄膜沉积在基板上,该基板被冷却到由工艺参数和物理条件确定的温度范围内。沉积的VDF低聚物或共低聚物薄膜的性能。在本发明的用于制造铁电存储单元或铁电存储装置的方法的应用中,以位于电极结构之间的VDF低聚物或VDF共低聚物的薄膜的形式提供铁电存储材料。以这种方式制造的铁电存储单元或铁电存储装置具有在第一和第二电极结构中的至少一个上设置的VDF低聚物或VDF共低聚物的薄膜形式的存储材料,从而提供了薄膜。在至少一个电极结构上或在第一和第二电极结构之间。

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