The invention relates to a method and device for operating and/or testing memory units, which make it possible to conduct a time-saving test of semiconductor memories during running operation. The inventive method for testing memory units (2) having storage locations (1) provides that, for the storage locations (1), a first item of test information is formed according to a variable parameter assigned to the respective storage location (1) and according to the contents of the respective storage location (1).
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