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Apparatus for temperature and current leakage measurement in chip, has linear outlet, which varies with temperature, where apparatus has current inverter and electronic module that digitizes current inverter
Apparatus for temperature and current leakage measurement in chip, has linear outlet, which varies with temperature, where apparatus has current inverter and electronic module that digitizes current inverter
The apparatus has a linear outlet, which varies with temperature. The apparatus has a current inverter and an electronic module that digitizes the current inverter.
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