SEQUENTIAL SCAN TEST OF INTERFACE BETWEEN IC MODULES THAT OPERATE AT DIFFERENT FREQUENCIES

摘要

Integrated circuit modules (160, 180) designed to operate at different frequencies in functional (normal) mode are tested using a sequential scan based technique at the respective frequencies. In one embodiment, the interface logic (170) connecting the two modules is tested for at-speed performance (i.e., the same speed at which the interface would be operated in functional mode during normal operation).