SYSTEM AND METHOD FOR TESTING AN INTEGRATED CIRCUIT DEVICE HAVING ELEMENTS WITH ASYNCHRONOUS CLOCKS OR DISSIMILAR DESIGN METHODOLOGIES

摘要

A system and method for testing an integrated circuit device with asynchronous clocks or dissimilar design methodologies are provided. With the system and method, each clock domain has its own scan paths that do not cross domain boundaries. By eliminating the scanning across the boundaries, the requirement to have two clock grids in the asynchronously clocked domains may be eliminated. As a result, circuit area and design time with regard to the clock distribution design are reduced. In addition, removing the second clock grid, i.e. the high speed core or system clock, in the asynchronously clocked domains removes the requirement to have a multiplexing scheme for selection of clocking signals in the asynchronous domain. In addition to the above, the system and method provide boundary built-in-self-test logic for testing the functional crossing logic of boundaries between the clock domains in a functional mode of operation.