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METHOD FOR MANUFACTURING IN-PLANE LATTICE CONSTANT ADJUSTING SUBSTRATE AND IN-PLANE LATTICE CONSTANT ADJUSTING SUBSTRATE

机译:制造平面晶格常数调整基板的方法及平面晶格常数调整基板

摘要

A method of adjusting the in-plane lattice constant of a substrate and an in-plane lattice constant adjusted substrate are provided. A crystalline substrate (1) made of SrTiO3 is formed at a first preestablished temperature thereon with a first epitaxial thin film (2) made of a first material, e. g., BaTiO3, and then on the first epitaxial thin film (2) with a second epitaxial thin film (6) made of a second material, e. g., BaxSr1-xTiO3 (where 0 x 1), that contains a substance of the first material and another substance which together therewith is capable of forming a solid solution in a preestablished component ratio. Thereafter, the substrate is heat-treated at a second preselected temperature. Heat treated at the second preestablished temperature, the substrate has dislocations (4) introduced therein and the second epitaxial thin film (6) has its lattice constant relaxed to a value close to the lattice constant of bulk crystal of the second material. Selecting the ratio of components x of the other substance in the second material allows a desired in-plane lattice constant to be realized.
机译:提供了一种调整基板的面内晶格常数的方法和调整面内的晶格常数的基板。在第一预定温度下,在其上形成由SrTiO3制成的晶体基板(1),该基板上由第一材料(例如,铝)制成的第一外延薄膜(2)。然后,在第一外延薄膜(2)上具有由第二材料(例如,BaTiO 3)制成的第二外延薄膜(6)。例如,BaxSr1-xTiO3(其中0 <x <1),其包含第一材料的物质和与之一起能够以预定的组分比形成固溶体的另一种物质。此后,在第二预选温度下对衬底进行热处理。在第二预定温度下进行热处理,衬底中引入了位错(4),并且第二外延薄膜(6)的晶格常数松弛到接近第二材料的体晶的晶格常数的值。选择第二材料中的另一种物质的成分x的比例允许实现期望的面内晶格常数。

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