首页>
外国专利>
NEAR FIELD SCANNING MEASUREMENT-ALTERNATING CURRENT-SCANNING ELECTROCHEMICAL MICROSCOPY DEVICES AND METHODS OF USE THEREOF
NEAR FIELD SCANNING MEASUREMENT-ALTERNATING CURRENT-SCANNING ELECTROCHEMICAL MICROSCOPY DEVICES AND METHODS OF USE THEREOF
展开▼
机译:近场扫描测量-交替扫描电流电化学显微装置及其使用方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
Briefly described, embodiments of this disclosure include near-field scanning measurement-alternating current-scanning electrochemical microscopy devices, near-field scanning measurement-alternating current-scanning electrochemical microscopy systems, methods of using near-field scanning measurement-alternating current-scanning electrochemical microscopy, atomic force measurement-alternating current-scanning electrochemical microscopy (AFM-AC-SECM) devices, AFM-AC-SECM systems, methods of using AFM-AC-SECM, and the like.
展开▼