Method for exploring feasibility of an electronic system design

摘要

The present invention provides a method for determining an estimate of system-level yield loss for an electronic system comprising individual components subject to manufacturing process variability leading to manufacturing defects. The method comprises obtaining a description of the composition of said electronic system in terms of which individual components are used; obtaining statistical properties of the performance of individual components of the electronic system with respect to 1st and 2nd performance variables, e.g. energy consumption and delay, the statistical properties including correlation information of the 1st and 2nd performance variables; obtaining information about execution of an application on the system, e.g. a number of accesses of a component by an application, and propagating the statistical properties of the 1st and 2nd performance variables of the individual components to the electronic system so that the correlations between the 1st and 2nd performance variables are preserved, the propagating taking into account the application information.