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PRODUCTION METHOD OF STRAINED SILICON-SOI SUBSTRATE AND STRAINED SILICON-SOI SUBSTRATE PRODUCED BY SAME

机译:应变硅溶胶基体的生产方法和相同方法生产的应变硅溶胶基体

摘要

PROBLEM TO BE SOLVED: To provide a strained Si-SOI substrate having flat surface in which defects are suppressed, and to provide its production process.;SOLUTION: The process for producing a strained Si-SOI substrate comprises a step for growing an SiGe mixed crystal layer 14 on an SOI substrate 10 having an Si layer 13 and a buried oxide film 12, a step for forming protection films 15 and 16 on the surface of the SiGe mixed crystal layer 14, a step for implanting ions of light element into the vicinity of interface between the Si layer 13 and the buried oxide film 12, a first heat treatment step performing heat treatment at 400-1,000°C, a second heat treatment step performing heat treatment in oxidizing atmosphere at 1,050°C or above, a third heat treatment step performing heat treatment in inactive atmosphere at 1,050°C or above, a step for removing an Si oxide film 18 on the surface, and a step for forming a strained Si layer 19.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供具有平坦表面的应变Si-SOI衬底,其中缺陷被抑制,并提供其生产工艺。解决方案:应变Si-SOI衬底的生产过程包括生长混合的SiGe的步骤。具有Si层13和掩埋氧化物膜12的SOI衬底10上的晶体层14,在SiGe混合晶体层14的表面上形成保护膜15和16的步骤,将光元素离子注入到SiGe混合晶体层14中的步骤。在Si层13和掩埋氧化膜12之间的界面附近,在400-1,000℃下进行热处理的第一热处理步骤,在1050℃或以上的氧化气氛中进行热处理的第二热处理步骤,第三步是在惰性气氛中于1050℃或更高的温度下进行热处理的第三步热处理步骤,用于去除表面上的氧化硅膜18的步骤,以及形成应变硅层19的步骤。版权所有:(C)2007 ,JPO&INPIT

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