首页> 外国专利> MASK FOR MAKING THIN FIME TRANSISTOR, THIN FIME TRANSISTOR PLATE MADE BY THE MASK AND METHOD FOR MAKING THE THIN FIME TRANSISTOR PLATE USING THE MASK

MASK FOR MAKING THIN FIME TRANSISTOR, THIN FIME TRANSISTOR PLATE MADE BY THE MASK AND METHOD FOR MAKING THE THIN FIME TRANSISTOR PLATE USING THE MASK

机译:用于制造薄膜晶体管的掩模,通过该掩模制成的薄膜晶体管板以及使用该掩模制造薄膜晶体管的方法

摘要

A mask for fabricating a TFT is provided to reduce a separation interval between a source electrode and a drain electrode by forming a single slit between a source mask pattern and a drain mask pattern wherein the slit has an interval not greater than the resolution of an exposure unit. A drain mask pattern(120) blocks light to form a drain electrode. A source mask pattern(130) blocks light to form a source electrode, confronting the drain mask pattern. A light introduction blocking pattern(160) reduces the light introduced from the outside to a gap between the source mask pattern and the drain mask pattern, formed between both ends of the source mask pattern and the drain mask pattern. The drain mask pattern and the source mask pattern are separated from each other by an interval not greater than the resolution of an exposure unit. The separation interval between the drain mask pattern and the source mask pattern can have a range of 2~3 smum.
机译:提供一种用于制造TFT的掩模,以通过在源掩模图案和漏掩模图案之间形成单个狭缝来减小源电极和漏电极之间的间隔,其中该狭缝的间隔不大于曝光分辨率。单元。漏掩模图案(120)阻挡光以形成漏电极。源掩模图案(130)阻挡光以形成面对漏掩模图案的源电极。导光阻挡图案(160)将从外部引入的光减少到在源掩模图案和漏掩模图案的两端之间形成的源掩模图案和漏掩模图案之间的间隙。漏极掩模图案和源极掩模图案彼此隔开不大于曝光单元的分辨率的间隔。漏极掩模图案与源极掩模图案之间的间隔可以具有2〜3smum的范围。

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