PHASE LOCKING LOOP CAPABLE OF BURN-IN TEST WITH MAXIMUM LOCKING RANGE AND BURN-IN TEST METHOD THE SAME

摘要

A phase locking loop capable of performing burn-in test as maximizing locking range and a burn-in test method thereof are provided to reduce overhead of chip area by generating clock signals used during burn-in test internally. A phase detection part(110) detects phase difference between a reference clock signal and an internal clock signal. A charge pump part(112) generates an adjustment voltage in response to the output of the phase detection part. A voltage controlled oscillator(116) generates the internal clock signal proportional to the adjustment voltage. A control part(120) controls the adjustment voltage in order to increase the phase difference between the reference clock signal and the internal clock signal, in response to a burn-in test mode signal.