首页> 外国专利> NON-CONTACT TYPE APPARATUS FOR MEASURING THE HEIGHT OF NEEDLE OF PROBE CARD

NON-CONTACT TYPE APPARATUS FOR MEASURING THE HEIGHT OF NEEDLE OF PROBE CARD

机译:用于测量探针卡针高的非接触式仪器

摘要

A non-contact type apparatus for measuring a height of a needle of a probe card is provided to obtain reliable data by using a short wavelength laser. A probe card is loaded on a main card installation plate(120). A cover plate(160) is installed on the main card installation plate. The cover plate includes an opening for exposing a center of the main card installation plate. A card installation reference plate(150) has a ring-shaped structure. An outer circumference of the card installation reference plate is loaded on the cover plate. An inner circumference of the card installation reference plate is closely attached to a periphery of the probe card. A laser unit is installed in a top space of the card installation reference plate. A height calculation unit measures a gap between the laser unit and the card installation reference plate in order to obtain a planar equation of the card installation reference plate, detects a gap between an end of the needle and the laser unit, and decides the height of the needle.
机译:提供一种用于测量探针卡的针的高度的非接触型设备,以通过使用短波长激光来获得可靠的数据。探针卡被装载在主卡安装板(120)上。盖板(160)安装在主卡安装板上。盖板包括用于暴露主卡安装板的中心的开口。卡安装基准板(150)具有环形结构。卡安装参考板的外圆周安装在盖板上。卡安装基准板的内周紧密地附接到探针卡的外围。激光单元安装在卡安装参考板的顶部空间。高度计算单元测量激光单元和卡安装参考板之间的间隙,以获得卡安装参考板的平面方程,检测针头和激光单元之间的间隙,并确定针头的高度。针。

著录项

  • 公开/公告号KR100791113B1

    专利类型

  • 公开/公告日2008-01-04

    原文格式PDF

  • 申请/专利权人 HNC INC.;

    申请/专利号KR20060133611

  • 发明设计人 MOON JANG HYUK;

    申请日2006-12-26

  • 分类号H01L21/66;G01B11/02;

  • 国家 KR

  • 入库时间 2022-08-21 19:52:43

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