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METHOD FOR MATCHING SIGMA THROUGH MODEL BASED OPC

机译:基于OPC的基于SIGMA模型的匹配方法

摘要

A method for matching a sigma through a model-based OPC(optical proximity correction) is provided to minimize a matching error between heterogeneous equipments by making an OPC model while using OPC data of reference equipment and heterogeneous equipment and by performing a sigma matching process through a model-based OPC. A sigma is set according to a characteristic between reference equipment and heterogeneous equipment(S100). OPC data of each equipment is gathered to set up an OPC model with respect to the reference equipment and the heterogeneous equipment(S102). The data gathered from each equipment is listed to make an OPC data sheet(S104). An OPC model is set up by using the OPC data sheet(S106). A sigma matching process between the reference equipment and the heterogeneous equipment is performed by using the set-up OPC model(S108). The process for making the OPC data sheet can include the following steps. An average value is calculated with respect to a pitch characteristic and an Iso line data of the reference equipment and the heterogeneous equipment. Data of equipment in which a small space is defined is selected while Iso space data of each equipment is not averaged. An average value is calculated with respect to 2D pattern data of each equipment to make the OPC data sheet.
机译:提供一种通过基于模型的OPC(光学接近校正)来对sigma进行匹配的方法,该方法通过在使用参考设备和异构设备的OPC数据的同时进行OPC模型并通过执行sigma匹配过程来最小化异构设备之间的匹配误差。基于模型的OPC。根据参考设备和异构设备之间的特性来设置总和(S100)。收集每个设备的OPC数据以针对参考设备和异构设备建立OPC模型(S102)。列出从每个设备收集的数据以形成OPC数据表(S104)。通过使用OPC数据表来建立OPC模型(S106)。通过使用建立的OPC模型来执行参考设备和异构设备之间的西格玛匹配处理(S108)。制作OPC数据表的过程可以包括以下步骤。关于基准设备和异构设备的音高特性和Iso线数据,计算平均值。在不对每个设备的Iso空间数据进行平均的情况下,选择定义空间小的设备数据。针对每个设备的2D图案数据计算平均值,以制作OPC数据表。

著录项

  • 公开/公告号KR100800685B1

    专利类型

  • 公开/公告日2008-02-01

    原文格式PDF

  • 申请/专利权人 DONGBU ELECTRONICS CO. LTD.;

    申请/专利号KR20060136986

  • 发明设计人 KIM YOUNG ROK;

    申请日2006-12-28

  • 分类号H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 19:52:36

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