首页> 外国专利> THE NONVOLATILE DRAM HAVING CAPACITORLESS DRAM CHARACTERISTIC AND NONVOLATILE MEMORY CHARACTERISTIC BY RESISTANCE SWITCHING MATERIAL

THE NONVOLATILE DRAM HAVING CAPACITORLESS DRAM CHARACTERISTIC AND NONVOLATILE MEMORY CHARACTERISTIC BY RESISTANCE SWITCHING MATERIAL

机译:具有电阻电容材料的非易失性DRAM具有非易失性DRAM特性和非易失性存储器特性

摘要

A non-volatile dram having a capacitorless dram characteristic and a non-volatile memory characteristic by a resistance switching material are provided to increase the degree of integration by removing a capacitor. A hole envelopment layer(110) is formed on a semiconductor substrate(100). A floating body(120) is formed on the hole envelopment layer. A resistance switching material layer(150) is formed on the floating body. A gate(160) is formed on the resistance switching material layer. A source and a drain are formed between the floating bodies on the hole envelopment layer. The hole envelopment layer is formed with an insulator. The hole envelopment layer is an ion implantation layer. The ion implantation layer is formed by implanting P type impurity ions into the semiconductor substrate.
机译:通过电阻切换材料提供具有无电容器的dram特性和非易失性存储特性的非易失性dram,以通过去除电容器来提高集成度。在半导体衬底(100)上形成空穴包封层(110)。在孔包封层上形成浮体(120)。电阻切换材料层(150)形成在浮体上。在电阻切换材料层上形成栅极(160)。在孔包封层上的浮体之间形成源极和漏极。孔包封层形成有绝缘体。空穴包封层是离子注入层。通过将P型杂质离子注入到半导体衬底中来形成离子注入层。

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