首页> 外国专利> Singulation of semiconductor wafers to form semiconductor chips, by inducing crystallographic strains into region of separating tracks using ion implantation of charged particles, and laser ablating along separating tracks

Singulation of semiconductor wafers to form semiconductor chips, by inducing crystallographic strains into region of separating tracks using ion implantation of charged particles, and laser ablating along separating tracks

机译:通过使用带电粒子的离子注入将结晶应变引入分离轨的区域中,并沿分离轨进行激光烧蚀,从而将半导体晶圆切单以形成半导体芯片

摘要

Singulation of semiconductor wafers (1) to form semiconductor chips, comprises inducing crystallographic strains (7) into a region of separating tracks (6) by using ion implantation of charged particles and/or ionized atoms that can be incorporated interstitially into the monocrystalline lattice of a semiconductor crystal; and laser ablating along the separating tracks. Induction of crystallographic strains into the region of separating tracks is effected by using ion implantation of carbon ions, nitrogen ions, oxygen ions, and/or silicon ions; noble gas ions; protons; or alpha -particles. Singulation of semiconductor wafers to form semiconductor chips, comprises producing a semiconductor wafer having semiconductor chip positions (5) arranged in rows and columns, separating tracks being arranged between the positions; inducing crystallographic strains into the region of the separating tracks by using ion implantation of charged particles and/or ionized atoms that can be incorporated interstitially into the monocrystalline lattice of a semiconductor crystal; laser ablating along the separating tracks; and separating of the semiconductor wafer into individual semiconductor chips. Induction of crystallographic strains into the region of separating tracks is effected by using ion implantation of carbon ions, nitrogen ions, oxygen ions, and/or silicon ions; noble gas ions; protons; alpha -particles; ions from the group of transition elements and/or from the group of lanthanides; or irradiation with formation of vacancy clusters effected by using infrared laser irradiation, laser irradiation with setting of depth-staggered focusing depths, or laser irradiation with staggered variation of the laser wavelength, in the range from near UV to far infrared. An independent claim is included for a semiconductor wafer.
机译:分离半导体晶片(1)以形成半导体芯片,包括通过使用带电粒子和/或电离原子的离子注入将结晶应变(7)诱导到分离轨迹(6)的区域中,这些离子可以通过间隙注入到单晶晶格中。半导体晶体;并沿分离轨道进行激光烧蚀。通过使用碳离子,氮离子,氧离子和/或硅离子的离子注入将结晶应变引入分离道的区域中。惰性气体离子质子或alpha粒子。分割半导体晶片以形成半导体芯片,包括:制造具有以行和列布置的半导体芯片位置(5),在所述位置之间布置分开的轨道的半导体晶片;通过使用带电粒子和/或电离原子的离子注入,将可间隙插入到半导体晶体的单晶晶格中的离子注入,将晶体学应变引入分离轨道的区域中;沿分离轨道进行激光烧蚀;将半导体晶片分离成单独的半导体芯片。通过使用碳离子,氮离子,氧离子和/或硅离子的离子注入将结晶应变引入分离道的区域中。惰性气体离子质子α粒子来自过渡元素组和/或镧系元素的离子;或通过使用红外激光辐射,设置深度交错聚焦深度的激光辐射或激光波长交错变化的激光辐射(从近紫外到远红外)来形成空位簇。对半导体晶片包括独立权利要求。

著录项

  • 公开/公告号DE102006028718A1

    专利类型

  • 公开/公告日2007-12-27

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE20061028718

  • 发明设计人 PRESSEL KLAUS;KOLLER ADOLF;THEUSS HORST;

    申请日2006-06-20

  • 分类号H01L21/30;

  • 国家 DE

  • 入库时间 2022-08-21 19:49:54

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