首页> 外国专利> Micro-lithographic projection illumination system for manufacturing e.g. highly integrated electrical circuit, has correction device including correction unit that is attached and demounted in objective without dismantling objective

Micro-lithographic projection illumination system for manufacturing e.g. highly integrated electrical circuit, has correction device including correction unit that is attached and demounted in objective without dismantling objective

机译:用于例如制造的微光刻投影照明系统。高度集成的电路,具有包括校正单元的校正装置,该校正装置可在不拆卸物镜的情况下客观地连接和拆卸

摘要

The system (10) has an immersion objective (20) provided for immersion operation, where a screen (24) is mapped on a light-sensitive layer (26) and an immersion fluid is present between the immersion objective and the light-sensitive layer. A correction device (34) reduces imaging errors, which are induced by directly applying a faceplate (36) on the light-sensitive layer such that the immersion fluid does not contact the light-sensitive layer. The correction device includes a correction unit that is attached and demounted in the objective without dismantling the objective. An independent claim is also included for a method for micro-lithographic manufacturing of a micro-structured component.
机译:系统(10)具有被设置用于浸没操作的浸没物镜(20),其中屏幕(24)被映射在光敏层(26)上,并且浸没流体存在于浸没物镜和光敏层之间。 。校正装置(34)减少了成像误差,该成像误差是通过将面板(36)直接施加在光敏层上而引起的,使得浸没流体不接触光敏层。校正装置包括校正单元,该校正单元在不拆卸物镜的情况下附接和拆卸在物镜中。还包括用于微光刻制造微结构部件的方法的独立权利要求。

著录项

  • 公开/公告号DE102006046675A1

    专利类型

  • 公开/公告日2008-04-03

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT AG;

    申请/专利号DE20061046675

  • 发明设计人 GOEHNERMEIER AKSEL;GARREIS REINER;

    申请日2006-09-29

  • 分类号G03F7/20;G02B13/14;

  • 国家 DE

  • 入库时间 2022-08-21 19:49:43

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