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Switch arrangement e.g. relay contact, examining method, involves utilizing test signal as indicator for switched path when comparison of test signal with stored signal sample, which results in compatible signal with signal sample
Switch arrangement e.g. relay contact, examining method, involves utilizing test signal as indicator for switched path when comparison of test signal with stored signal sample, which results in compatible signal with signal sample
The method involves conducting a test signal (PH1-PHn) over one of switched paths on an output side in a trouble-free condition, and assigning the test signal to an evaluation device (A). A permissible signal sample is stored in the evaluation device, and the test signal assigned to the evaluation device is compared with the stored signal sample. The test signal is utilized as an indicator for the switched path when the comparison results in a compatible signal with the stored signal sample. An alternating voltage signal is fed as a reference signal (PHR) to the evaluation device. An independent claim is also included for a device for examining a switch arrangement.
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