首页> 外国专利> A method of forming a semiconductor structure, which is a field effect - transistor with the pretensioned channel region comprises

A method of forming a semiconductor structure, which is a field effect - transistor with the pretensioned channel region comprises

机译:一种形成半导体结构的方法,该半导体结构是场效应-具有预拉伸沟道区的晶体管,包括

摘要

A method for forming a semiconductor structure comprises a providing a half conductor ubs retentate, which is a first transistor elements and a second transistor cell comprises. The first transistor element comprises at least a first amorphous area and the second transistor element comprises at least a second amorphous field. A power layer is formed by means of the first transistor cell. The power layer covers the second transistor element not. A first heat treatment is carried out. The first heat treatment is designed for this purpose, the first amorphous area and the second amorphous field to recrystallize. After the first heat treatment, a second thermal treatment is carried out. The power layer remains during the second heat treatment on the semiconductor substrate.
机译:一种用于形成半导体结构的方法,包括提供半导体UBS保留物,其为第一晶体管元件和第二晶体管单元。第一晶体管元件包括至少第一非晶区域,第二晶体管元件包括至少第二非晶场。借助于第一晶体管单元形成功率层。功率层没有覆盖第二晶体管元件。进行第一热处理。为此设计第一热处理,使第一非晶区和第二非晶场重结晶。在第一热处理之后,进行第二热处理。功率层在第二热处理期间保留在半导体衬底上。

著录项

  • 公开/公告号DE102006051494A1

    专利类型

  • 公开/公告日2008-05-08

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE20061051494

  • 发明设计人

    申请日2006-10-31

  • 分类号H01L21/336;

  • 国家 DE

  • 入库时间 2022-08-21 19:49:38

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