A method for testing an integrated circuit die with at least two circuit cores, as well as an integrated circuit chip and test system

摘要

An integrated circuit chip, comprising:a test input (210) for receiving test data;an expectation values input (220) for receiving from the expected result data;at least two circuit cores (230, 240, 250), wherein each core a core - test input (231, 241, 251) and a core - test output (239, 249, 259) and each core is arranged, test data of the test input (210) at its core - test input (231, 241, 251) to receive data, test result data in accordance with the received test data and the generated test result data to generate at its core - test output (239, 249, 259) to provide;a comparison circuit (260) for comparing the test result data of the core - test outputs (239, 249, 259) and the received expected result data for each core (230, 240, 250), in order for each core (230, 240, 250) to generate data comparison result, which indicate whether there is a difference between the test result data and the expected result data, or not; anda diagnosis data unit (290) for storing of diagnostic data in the case of a for a specific core displayed inequality, wherein the diagnostic data..