Circuit arrangement for e.g. personal computer, has scan-test and data input layers with respective inputs for inputting test and input signals, and latch coupled with respective output of scan test and data input layers

摘要

The arrangement has a scan-test input layer (702) with a test-input (706) for inputting a test-signal (704). A data-input layer has a data-input (302) for inputting a data signal (322). A latch is coupled with an output of the scan-test input layer and with an output of the data-input layer. A clock signal generator (722) has two clock generator-outputs, and the scan-test input layer has a clock signal input that is coupled with one of the clock generators. The data-test input layer has another clock signal input that is coupled with the other clock generator. An independent claim is also included for a method for operating a circuit arrangement.