首页> 外国专利> Method and system for reducing the exposure fields by means of mounting errors in by means of apc - control strategies comprises circuitry arranged

Method and system for reducing the exposure fields by means of mounting errors in by means of apc - control strategies comprises circuitry arranged

机译:用于通过apc控制策略通过安装误差来减小曝光场的方法和系统包括布置的电路

摘要

By taking into consideration plant-specific signal distortion signatures and reticle specific positioning properties in a adjustment, the control system, the control quality of modern apc - strategies are significantly improved. Corresponding correction data, on the basis of combinations of installation / reticles and layers, which are to be adjusted with respect to one another, to be determined, which is then the corresponding desired values of adjustment can modify parameters for controlling the adjustment processes on the basis of standard by means of mounting mes data are used, which are obtained from corresponding overlay marks.
机译:通过在调整中考虑特定于工厂的信号失真特征和标线片的特定定位特性,可以显着提高现代apc策略的控制系统的控制质量。基于要相对于彼此调节的安装/掩模版和层的组合来确定相应的校正数据,然后,相应的期望的调节值可以修改用于控制在玻璃上的调节过程的参数。使用通过安装mes数据获取的标准数据,这些数据是从相应的叠加标记获得的。

著录项

  • 公开/公告号DE102007038702A1

    专利类型

  • 公开/公告日2008-07-31

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE20071038702

  • 发明设计人

    申请日2007-08-16

  • 分类号G03F9/00;

  • 国家 DE

  • 入库时间 2022-08-21 19:49:10

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