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Method of manufacture of objects sub - micrometric suspended from a mechanical characterization of the objects

机译:从物体的机械表征悬浮的亚微米物体的制造方法。

摘要

The method involves producing sub-micrometric objects (38) on a transfer layer and making hard masks on a part of the layer for delimiting an area comprising a part of the objects. An assembly formed by the masks, the layer and a recess layer are etched to eliminate the masks and the transfer layer`s part and to hollow out a part of the recess layer situated under the area such that the objects are suspended. The speed of the etching of the recess layer is greater than the etching speed of the transfer layer and the hard masks. An independent claim is also included for a microelectronic component manufactured according to a sub-micrometric object manufacturing method.
机译:该方法包括在转移层上产生亚微米级的物体(38),并在该层的一部分上制作硬掩模,以划定包括一部分物体的区域。蚀刻由掩模,层和凹进层形成的组件,以去除掩模和转移层的一部分,并挖空位于该区域下方的凹进层的一部分,以使物体被悬挂。凹陷层的蚀刻速度大于转印层和硬掩模的蚀刻速度。还包括根据亚微米物体制造方法制造的微电子部件的独立权利要求。

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