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LASER INTERFEROMETER, AND LASER INTERFEROMETRY

机译:激光干涉仪和激光干涉仪

摘要

PROBLEM TO BE SOLVED: To provide a laser interferometer and laser interferometry for suppressing the manufacturing cost and eliminating the influence of modulation.;SOLUTION: This laser interferometer measures a length based on laser light interference. The laser interferometer comprises a laser light producing section 10 for producing a laser light L1 modulated with a modulation signal Sg4 of a modulation frequency fm; an interferometer unit 20 for radiating the laser light L1 from the laser light producing section 10 to a moving mirror 30 to produce laser light L4 containing length measurement information and receiving the laser light L4 at a light receiving section 20b to create first and second electric signals ϕA and ϕB containing length measurement information; and a sampling unit 40 for sampling the first and second electric signals ϕA and ϕB in synchronization with a timing signal Sg8 of a sampling frequency fs produced on the basis of the modulation signal Sg2 of the modulation frequency fm.;COPYRIGHT: (C)2010,JPO&INPIT
机译:要解决的问题:提供一种激光干涉仪和激光干涉仪,以降低制造成本并消除调制的影响。解决方案:该激光干涉仪测量基于激光干扰的长度。激光干涉仪包括:激光产生部10,用于产生由调制频率fm的调制信号Sg4调制的激光L1;和干涉仪单元20,用于将激光L1从激光产生部10照射到移动镜30,以产生包含长度测量信息的激光L4,并在光接收部20b接收激光L4以产生第一和第二电信号。包含长度测量信息的&A和&B;采样单元40,用于与基于调制频率fm的调制信号Sg2产生的采样频率fs的定时信号Sg8同步地对第一电信号φA和第二电信号φB进行采样。 (C)2010,日本特许厅&INPIT

著录项

  • 公开/公告号JP2009250786A

    专利类型

  • 公开/公告日2009-10-29

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20080099095

  • 发明设计人 OZEKI HIRAKAZU;

    申请日2008-04-07

  • 分类号G01B9/02;

  • 国家 JP

  • 入库时间 2022-08-21 19:45:17

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