首页> 外国专利> LEAK INSPECTION APPARATUS FOR ELECTRONIC COMPONENTS AND LEAK INSPECTION TECHNIQUE OF ELECTRONIC COMPONENT

LEAK INSPECTION APPARATUS FOR ELECTRONIC COMPONENTS AND LEAK INSPECTION TECHNIQUE OF ELECTRONIC COMPONENT

机译:电子部件的泄漏检查装置及电子部件的泄漏检查技术

摘要

PROBLEM TO BE SOLVED: To provide a leak inspection apparatus for electronic components and a leak inspection technique of electronic component capable of implementing, at high speeds and at a moderate price, leak inspection for electronic components such as acceleration sensor and the like.;SOLUTION: The leak inspecting apparatus of an electronic component 200 outputting electric signal predetermined due to bias of an inertia body inside a packaging is a leak inspecting apparatus which is equipped with a power supply device 140 applying operating voltage containing fluctuation component with a predetermined frequency to the electronic component 200, a detecting device 130 detecting output from the electronic component, and an evaluating device 160 comparing the output value acquired from the detecting device and a reference value to determine airtightness of the electronic component.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种用于电子部件的泄漏检查设备和一种电子部件的泄漏检查技术,该技术能够以高速度和适中的价格实现诸如加速度传感器等电子部件的泄漏检查。 :输出由于包装内部的惯性体的偏压而预定的电信号的电子部件200的泄漏检查装置是一种泄漏检查装置,该泄漏检查装置配备有将包含具有预定频率的波动成分的工作电压施加到容器的电源装置140。电子元件200,检测电子元件输出的检测装置130和评估装置160,将从检测装置获得的输出值与参考值进行比较,以确定电子元件的气密性。版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2009250938A

    专利类型

  • 公开/公告日2009-10-29

    原文格式PDF

  • 申请/专利权人 AKIM KK;

    申请/专利号JP20080102975

  • 发明设计人 MOMOSE KAZUHISA;

    申请日2008-04-11

  • 分类号G01M3/04;G01P21/00;

  • 国家 JP

  • 入库时间 2022-08-21 19:45:17

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